Breakthrough Chip Wiring Innovations for More Energy-Efficient Computing

Monday, 8 July 2024, 11:30

Applied Materials unveils groundbreaking chip wiring innovations with their latest Integrated Materials Solution, extending copper wiring to 2nm and beyond. The Endura Copper Barrier Seed IMS with Volta Ruthenium CVD combines advanced technologies to enable chipmakers to scale copper wiring for future nodes, improving chip performance and power consumption significantly.
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Breakthrough Chip Wiring Innovations for More Energy-Efficient Computing

Applied Materials Introduces Breakthrough Chip Wiring Innovations

Applied Materials has announced the latest Integrated Materials Solution, revolutionizing chip wiring by extending copper capabilities beyond 2nm.

New Endura Copper Barrier Seed IMS with Volta Ruthenium CVD

The innovative solution combines six unique technologies, setting a new industry standard for wiring efficiency.

  • Industry-First Combination of Materials enables scaling copper wiring to 2nm and beyond
  • Ruthenium and Cobalt Integration enhances chip performance and reduces power consumption

This article was prepared using information from open sources in accordance with the principles of Ethical Policy. The editorial team is not responsible for absolute accuracy, as it relies on data from the sources referenced.


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